Wavevue Measurement Studio
_
Wavevue Measurement Studio is an integrated measurement solution that unifies RF/microwave and DC measurements in one software application. Modules are purchased separately to enable custom configurations for each customer solution. In addition to the modules listed below, Microvue can also be contracted for custom development of new measurement modules to fit your needs. S-Parameters (2 Port and Multiport) DC Bias and Curves I-V Measurements Pulsed I-V Measurements (AMCAD, DIVA) C-V Measurements Power Measurements (Pout, Efficiency, ACPR, IMX, ...) Noise Measurements (50Ohm NF) Wafer Prober Control Compatible with Wafer probers from major manufacturers Exports to ADS and ICCAP (Keysight) Conditional branching and DLL capability Switch matrix control |
Wavevue Installations
A Total Measurement Solution for RF and IV On-wafer Characterization
|